• DocumentCode
    664348
  • Title

    A 60-GHz low DC power self-injection coupling CMOS quadrature voltage-controlled oscillator with high quadrature accuracy

  • Author

    Chi-Hsien Lin ; Yu-Cheng Liu ; Yen-Liang Yeh ; Han-Chi Chiu ; Hong-Yeh Chang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
  • fYear
    2013
  • fDate
    2-7 June 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A 60-GHz high quadrature accuracy low dc power quadrature voltage-controlled oscillator (QVCO) using self-injection coupling (SIC) is proposed and demonstrated in 90 nm CMOS technology. By using SIC technique, this QVCO achieves low phase noise and good quadrature accuracy. Moreover, the amplitude/phase errors of the QVCO are fully characterized via a four-port vector network analyzer. The proposed 60-GHz QVCO exhibits a phase noise of -95 dBc/Hz at 1-MHz offset frequency, an amplitude error of 0.12 dB, and a phase errors of 1.2°. The dc power consumption is 13.3 mW with a supply voltage of 0.7 V. The chip size of the proposed QVCO is 0.75×0.6 mm2. This work has the lowest dc power consumption and the best figure-of-merits with high quadrature accuracy among the all reported millimeter-wave CMOS QVCOs.
  • Keywords
    CMOS integrated circuits; field effect MIMIC; low-power electronics; millimetre wave oscillators; network analysers; phase noise; voltage-controlled oscillators; CMOS quadrature voltage-controlled oscillator; amplitude/phase errors; chip size; dc power consumption; figure-of-merits; four-port vector network analyzer; frequency 60 GHz; high quadrature accuracy; low DC power self-injection coupling; low phase noise; power 13.3 mW; voltage 0.7 V; Accuracy; CMOS integrated circuits; Frequency measurement; Phase measurement; Phase noise; Voltage measurement; Voltage-controlled oscillators; CMOS; low dc power; low phase noise; quadrature voltage-controlled oscillator (QVCO);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-6177-4
  • Type

    conf

  • DOI
    10.1109/MWSYM.2013.6697354
  • Filename
    6697354