• DocumentCode
    664376
  • Title

    Bond-wire engineering to improve power performance in multi-cell GaN package devices

  • Author

    Halder, Sebastian ; McMacken, John ; Runton, Dave

  • fYear
    2013
  • fDate
    2-7 June 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Power distribution across large multi-cell GaN packaged device studied through 3D EM simulation to show significant non-uniformity in output power, phase and temperature in unmatched standard parts. A simple technique by changing drain bond-wire lengths to equalize the phase front has been shown to improve the combining efficiency of the power cells which in turn improves gain and power performance by 10-15% at higher frequencies of 3.5GHz at 48V without sacrificing the low frequency response.
  • Keywords
    III-V semiconductors; gallium compounds; power semiconductor devices; semiconductor device models; semiconductor device packaging; wide band gap semiconductors; 3D EM simulation; bond wire engineering; drain bond wire lengths; frequency 3.5 GHz; low frequency response; multicell package devices; phase front; power cells; power distribution; power performance; voltage 48 V; Gain; Gallium nitride; Logic gates; Power distribution; Power generation; Solid modeling; Standards; GAN HEMTs; Power transistors; powerbars; semiconductor device modeling; semiconductor device packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-6177-4
  • Type

    conf

  • DOI
    10.1109/MWSYM.2013.6697383
  • Filename
    6697383