• DocumentCode
    664578
  • Title

    A 1.5–2.4 GHz tunable 4-pole filter using commercial high-reliability 5-bit RF MEMS capacitors

  • Author

    Ko, C.H. ; Ho, K.M.J. ; Gaddi, Roberto ; Rebeiz, Gabriel M.

  • Author_Institution
    Univ. of California, San Diego, La Jolla, CA, USA
  • fYear
    2013
  • fDate
    2-7 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a 1.5-2.4 GHz 4-pole tunable filter using the Cavendish Kinetics RF MEMS capacitors. The MEMS capacitors are fabricated and fully packaged using a 0.18 μm CMOS standard process with integrated high voltage drivers and SPI control logic and with reliability in the billions of cycles. The filter results in a power handling of at least 20 dBm, a second and third harmonic generation of <; -125 dBc at 20 dBm, and an OIP3 of 33-35 dBm. The measured ACPR (adjacent channel power ratio) for a 5-MHz Wideband CDMA signal is ~45-48 dBm at 20 dBm input power. The paper also discusses the requirements on RF MEMS capacitors in order to achieve high performance filters for wireless systems.
  • Keywords
    CMOS analogue integrated circuits; UHF filters; code division multiple access; driver circuits; integrated circuit reliability; micromechanical devices; CMOS standard process; Cavendish Kinetics RF MEMS capacitors; SPI control logic; adjacent channel power ratio; commercial high-reliability RF MEMS capacitors; frequency 1.5 GHz to 2.4 GHz; high-performance filters; integrated high-voltage drivers; measured ACPR; power handling; second-harmonic generation; size 0.18 mum; third-harmonic generation; tunable 4-pole filter; wideband CDMA signal; wireless systems; Capacitance; Capacitors; Frequency measurement; Kinetic theory; Micromechanical devices; Radio frequency; Transmission line measurements; RF MEMS; base stations; high power; reliability; tunable filters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-6177-4
  • Type

    conf

  • DOI
    10.1109/MWSYM.2013.6697589
  • Filename
    6697589