• DocumentCode
    664668
  • Title

    A semi-empirical large-signal compact model for RF carbon nanotube field-effect transistors

  • Author

    Schroter, Michael ; Haferlach, Max ; Sakalas, Paulius ; Claus, Martin

  • Author_Institution
    CEDIC, Tech. Univ. Dresden, Dresden, Germany
  • fYear
    2013
  • fDate
    2-7 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new compact large-signal model for CNTFETs is presented. The model is oriented towards practical requirements for RF analog circuit design, thus overcoming accuracy and discontinuity issues of existing models. Due to the difficulties of obtaining a compact analytical solution for the Landauer equation as well as for the injected and accumulated charge on the tube, a semi-empirical formulation for the drain current and tube charge has been developed. The complete model is scalable towards multi-tube multi-finger RF CNTFET structures and includes the effects of metallic tubes, contact resistances, parasitic capacitances, self-heating and hysteresis. Experimental verification of the model is shown based on pulsed DC and RF measurements.
  • Keywords
    analogue integrated circuits; carbon nanotube field effect transistors; radiofrequency integrated circuits; Landauer equation; RF CNTFET structures; RF analog circuit design; RF carbon nanotube field-effect transistors; RF measurements; accumulated charge; contact resistances; hysteresis; injected charge; metallic tubes; multitube multifinger structures; parasitic capacitances; pulsed DC measurements; self-heating; semiempirical formulation; semiempirical large-signal compact model; CNTFETs; Electron tubes; Integrated circuit modeling; Mathematical model; Radio frequency; Semiconductor device modeling; CNTFET modeling; CNTFET technology; Carbon nanotube FETs; RF applications; compact modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-6177-4
  • Type

    conf

  • DOI
    10.1109/MWSYM.2013.6697679
  • Filename
    6697679