• DocumentCode
    665895
  • Title

    Multiple open-switch faults detection and fautls tolerant method of three-level three-phase NPC active rectifier

  • Author

    Hyun-Keun Ku ; Jang-Mok Kim

  • Author_Institution
    Dept. of Electr. Eng., Pusan Nat. Univ., Busan, South Korea
  • fYear
    2013
  • fDate
    10-13 Nov. 2013
  • Firstpage
    1062
  • Lastpage
    1067
  • Abstract
    This paper presents multiple open-switch faults detection and faults tolerant methods for the 3-level 3-phase neutral point clamped (NPC) active rectifier. The 3-level 3-phase NPC active rectifier is comprised of many switching elements, which is increased the probability of open-switch faults compared to conventional 3-phase AC/DC PWM converter. These open-switch faults generate the imbalance of the input AC currents and output DC-link voltage pulsation. As a result, system performance and efficiency are reduced. Therefore, accurate and quick fault detection is required. Further fault tolerant is needed. In this paper suggests the multiple open-switch faults detection method and fault tolerant without additional component. The proposed faults detection method is getting by combination of grid angle and output DC-link voltage ripple component. The fault tolerant is implemented by changing voltage reference. The usefulness of the proposed methods is verified through the simulation results.
  • Keywords
    fault diagnosis; fault tolerance; rectifiers; switches; faults tolerant method; input AC currents; multiple open switch faults detection; neutral point clamped active rectifier; output DC link voltage pulsation; switching elements; three level three phase NPC active rectifier; voltage reference; Circuit faults; Fault tolerance; Fault tolerant systems; Rectifiers; Switches; Trajectory; Vectors; 3-level 3-phase NPC active rectifier; fault detection; fault tolerant; multiple open-switch faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
  • Conference_Location
    Vienna
  • ISSN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2013.6699280
  • Filename
    6699280