DocumentCode
668850
Title
Study of high reliability NoC based on power gating
Author
Hua Zhang ; Chunzhi Liu ; Tao Wang ; Hui Zhang
Author_Institution
China Aero-Polytechnology Establ., Beijing, China
fYear
2013
fDate
20-22 Nov. 2013
Firstpage
623
Lastpage
626
Abstract
Due to extensibility and high performance of Network on Chip (NoC), it has been considered as a new paradigm in the next generation communication architecture. However, increased power consumption has reduced the reliability of NoC and hindered its wide-deployment. In this paper, we propose a new design of high reliability NoC based on Power Gating, which can switch routers on or off by monitoring each port of routers. Our study shows that the proposed method is effective in reducing static power and improving reliability.
Keywords
integrated circuit design; integrated circuit reliability; network-on-chip; power consumption; NoC; network on chip; next generation communication architecture; power consumption; power gating; routers; static power; Computer architecture; Leakage currents; Monitoring; Payloads; Power demand; Reliability; Switches; NoC; high reliabilit; lower power; power gating; router;
fLanguage
English
Publisher
ieee
Conference_Titel
Consumer Electronics, Communications and Networks (CECNet), 2013 3rd International Conference on
Conference_Location
Xianning
Print_ISBN
978-1-4799-2859-0
Type
conf
DOI
10.1109/CECNet.2013.6703408
Filename
6703408
Link To Document