• DocumentCode
    669975
  • Title

    Modelling insight into the resonance frequencies of the microwave impedance parameters for GaAs HEMTs

  • Author

    Crupi, Giovanni ; Raffo, Antonio ; Schreurs, Dominique M. M.-P ; Avolio, Gustavo ; Caddemi, Alina ; Vannini, Giorgio

  • Author_Institution
    DICIEAMA, Univ. of Messina, Messina, Italy
  • Volume
    01
  • fYear
    2013
  • fDate
    16-19 Oct. 2013
  • Firstpage
    184
  • Lastpage
    187
  • Abstract
    The aim of this paper is to present a detailed and thorough investigation of the dips in the magnitude of the impedance parameters for AlGaAs/GaAs HEMTs. These dips should be attributed to the resonance between the extrinsic inductances and the intrinsic capacitances. As a consequence, the resonance frequencies associated to these dips can be analyzed to determine the intrinsic capacitances when the extrinsic inductances are known. To verify the validity of this straightforward approach, the extracted capacitances are compared with the results obtained with the conventional modelling method. The comparison is performed versus the gate-source voltage and the gate width.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; microwave transistors; semiconductor device models; AlGaAs-GaAs; HEMT; extrinsic inductances; gate width; gate-source voltage; intrinsic capacitances; microwave impedance parameters; resonance frequencies; Capacitance; Equivalent circuits; Gallium arsenide; HEMTs; Logic gates; MODFETs; Resonant frequency; HEMT; intrinsic capacitances; scattering parameter measurements; semiconductor device modelling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telecommunication in Modern Satellite, Cable and Broadcasting Services (TELSIKS), 2013 11th International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    978-1-4799-0899-8
  • Type

    conf

  • DOI
    10.1109/TELSKS.2013.6704916
  • Filename
    6704916