DocumentCode
669975
Title
Modelling insight into the resonance frequencies of the microwave impedance parameters for GaAs HEMTs
Author
Crupi, Giovanni ; Raffo, Antonio ; Schreurs, Dominique M. M.-P ; Avolio, Gustavo ; Caddemi, Alina ; Vannini, Giorgio
Author_Institution
DICIEAMA, Univ. of Messina, Messina, Italy
Volume
01
fYear
2013
fDate
16-19 Oct. 2013
Firstpage
184
Lastpage
187
Abstract
The aim of this paper is to present a detailed and thorough investigation of the dips in the magnitude of the impedance parameters for AlGaAs/GaAs HEMTs. These dips should be attributed to the resonance between the extrinsic inductances and the intrinsic capacitances. As a consequence, the resonance frequencies associated to these dips can be analyzed to determine the intrinsic capacitances when the extrinsic inductances are known. To verify the validity of this straightforward approach, the extracted capacitances are compared with the results obtained with the conventional modelling method. The comparison is performed versus the gate-source voltage and the gate width.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; microwave transistors; semiconductor device models; AlGaAs-GaAs; HEMT; extrinsic inductances; gate width; gate-source voltage; intrinsic capacitances; microwave impedance parameters; resonance frequencies; Capacitance; Equivalent circuits; Gallium arsenide; HEMTs; Logic gates; MODFETs; Resonant frequency; HEMT; intrinsic capacitances; scattering parameter measurements; semiconductor device modelling;
fLanguage
English
Publisher
ieee
Conference_Titel
Telecommunication in Modern Satellite, Cable and Broadcasting Services (TELSIKS), 2013 11th International Conference on
Conference_Location
Nis
Print_ISBN
978-1-4799-0899-8
Type
conf
DOI
10.1109/TELSKS.2013.6704916
Filename
6704916
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