• DocumentCode
    673391
  • Title

    Millimeter wave measurement of the TM mode cutoff for EBG structures fabricated in LTCC for antenna applications

  • Author

    McKinzie, William E. ; Nair, Darsana M. ; Thrasher, Bradley A. ; Smith, Michael A. ; Hughes, Elizabeth D. ; Parisi, James M.

  • Author_Institution
    WEMTEC, Inc., Fulton, MD, USA
  • fYear
    2013
  • fDate
    7-13 July 2013
  • Firstpage
    83
  • Lastpage
    84
  • Abstract
    This paper presents characterization of low temperature co-fired ceramic (LTCC) based electromagnetic bandgap (EBG) structures, and a test method to measure the TM mode cutoff frequency at millimeter wave frequencies. This test method differs from prior art in that the TM mode surface wave launchers are fabricated in the same LTCC module as the EBG structure under test to realize a compact and repeatable test vehicle. A pair of two port transmission measurements will experimentally yield the TM mode cutoff frequency. This frequency defines the lower bound for the surface wave bandgap. The TM mode cutoff frequency is a very important parameter where EBG structures are integrated into millimeterwave LTCC antennas because this cutoff frequency must be lower than the antenna´s operational frequency range. This proposed test method may be used with any open EBG structure which exhibits a TM mode cutoff frequency.
  • Keywords
    ceramic packaging; millimetre wave antennas; millimetre wave measurement; photonic band gap; EBG structure; EBG structures; LTCC module; TM mode cutoff frequency; TM mode surface wave launchers; antenna applications; antenna operational frequency range; compact vehicle; electromagnetic bandgap; low temperature co-fired ceramic; millimeter wave frequencies; millimeter wave measurement; millimeterwave LTCC; repeatable test vehicle; Antennas; Cutoff frequency; Frequency measurement; Metamaterials; Millimeter wave measurements; Periodic structures; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-5315-1
  • Type

    conf

  • DOI
    10.1109/APS.2013.6710702
  • Filename
    6710702