• DocumentCode
    673719
  • Title

    Equivalent circuit of the double-fishnet metamaterial

  • Author

    Torres, V. ; Rodriguez-Ulibarri, Pablo ; Falcone, Francisco ; Beruete, M. ; Navarro-Cia, M.

  • Author_Institution
    Dept. Electr. & Electron. Eng., Univ. Publica de Navarra, Pamplona, Spain
  • fYear
    2013
  • fDate
    7-13 July 2013
  • Firstpage
    1364
  • Lastpage
    1365
  • Abstract
    In this paper, an equivalent circuit for the fishnet metamaterial of two stacked holey metallic layers it is shown. All lumped elements of the circuit are extracted from a full physical interpretation of its electrodynamics when the structure is excited with a normally incident plane wave. Besides the well known LC parallel tank that accounts for the transmission through a single subwavelength hole array, the coupling between the layers is modeled as another LC series tank which is also related with the non-propagating higher order modes. The effective index of refraction and the scattering parameters retrieved from the proposed circuit matches remarkably the one obtained from full-wave numerical calculations. The importance of the extraordinary transmission (ET) phenomenon in the electromagnetic behavior of the fishnet metamaterial is shown as well.
  • Keywords
    electrodynamics; electromagnetic wave refraction; electromagnetic wave scattering; electromagnetic wave transmission; equivalent circuits; microwave metamaterials; LC parallel tank; double-fishnet metamaterial; effective index of refraction; electrodynamics; electromagnetic behavior; equivalent circuit; extraordinary transmission phenomenon; incident plane wave; lumped elements; nonpropagating higher order modes; scattering parameters; single subwavelength hole array; stacked holey metallic layers; Arrays; Equivalent circuits; Indexes; Integrated circuit modeling; Magnetic materials; Metamaterials; Numerical models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-5315-1
  • Type

    conf

  • DOI
    10.1109/APS.2013.6711341
  • Filename
    6711341