• DocumentCode
    678764
  • Title

    Functional verification of complete sequential behaviors: A formal treatment of discrepancies between system-level and RTL descriptions

  • Author

    Castro Marquez, Carlos Ivan ; Strum, Marius ; Wang Jiang Chau

  • Author_Institution
    Dept. of Electron. Syst., Univ. of Sao Paulo, Sao Paulo, Brazil
  • fYear
    2013
  • fDate
    16-18 Dec. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Formal techniques allow exhaustive verification on circuit design (at least in theory), but due to actual computational limitations, workarounds must always be adopted to check only a portion of the design at a time. Sequential equivalence checking is an effective approach, but it can only be applied between circuit descriptions where a one-to-one correspondence for states, as well as for memory elements, is expected. This paper presents a formal methodology to verify RTL descriptions through direct comparison with high-level reference models. By doing so, there is no need to specify or analyze formal properties, as the complete behavior is already contained in the reference model. We also consider the natural discrepancies between system level and RTL code, including non-matching interface and memory elements, and state mapping. In this manner, we are able to prove the functional coherence for the overall sequential behavior of the design under verification.
  • Keywords
    digital circuits; finite state machines; formal verification; hardware description languages; high level synthesis; RTL descriptions; circuit design; complete sequential behaviors; design under verification; exhaustive verification; formal methodology; functional coherence; functional verification; high level reference models; memory elements; sequential equivalence checking; system level descriptions; Automata; Complexity theory; Computational modeling; Concurrent computing; Data models; Integrated circuit modeling; Model checking; Formal RTL validation; finite state machine with data; process concurrency; reference model; state sequence coverage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Symposium (IDT), 2013 8th International
  • Conference_Location
    Marrakesh
  • Type

    conf

  • DOI
    10.1109/IDT.2013.6727074
  • Filename
    6727074