DocumentCode
683424
Title
Lifetime testing of metallized thin film capacitors for inverter applications
Author
Flicker, Jack ; Kaplar, Robert ; Marinella, Matthew ; Granata, Jennifer
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
fYear
2013
fDate
16-21 June 2013
Firstpage
3340
Lastpage
3342
Abstract
In order to understand the degradation mechanisms and failure precursors of metallized thin film capacitors (MTFC) used in photovoltaic (PV) inverters, we have carried out accelerated testing on MTFCs. By understanding the degradation mechanisms and precursors of imminent catastrophic failure, implementation of a prognostics and health management (PHM) plan can be used to optimize PV array operations and maintenance (O&M), decreasing cost per watt towards the US Department of Energy goals.
Keywords
invertors; life testing; solar cells; thin film capacitors; PV array operations; US Department of Energy goals; accelerated testing; degradation mechanisms; failure precursors; imminent catastrophic failure; lifetime testing; metallized thin film capacitors; photovoltaic inverters; prognostics and health management plan; Capacitance; Capacitors; Degradation; Heating; Inverters; Life estimation; Testing; PV systems; capacitors; inverter reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location
Tampa, FL
Type
conf
DOI
10.1109/PVSC.2013.6745166
Filename
6745166
Link To Document