• DocumentCode
    683596
  • Title

    A novel manufacturing technology for tensile test specimens for the characterization of copper in plated through holes (PTH)

  • Author

    Konstantin, Georg ; Kuck, Heinz ; Munch, Reinhold

  • Author_Institution
    Automotive Electron., Robert Bosch GmbH, Stuttgart, Germany
  • fYear
    2013
  • fDate
    11-13 Dec. 2013
  • Firstpage
    33
  • Lastpage
    36
  • Abstract
    Plated Through Holes (PTH) in Printed Circuit Boards (PCB) are exposed to high thermal loads during the manufacturing process and in field application. This is due to a significant difference in the coefficients of thermal expansion between base material (epoxy resin) and copper barrel. For the assessment of the PTH reliability, the knowledge of the material properties of the electro-deposited copper is of great importance. In this article the elongated hole specimen technique is introduced as a novel manufacturing technology for tensile test samples. With this simple and inexpensive method, stress-strain curves of copper layers are generated for the first time, with specimens that have similar deposition conditions and roughness as the copper barrel within the PTH. The method can be integrated into the PCB series production without additional cost of material or expenses and is particularly suitable for in-line process control of electroplating. With the film-like sample tensile tests were carried out successfully in an ambient temperature range of 20°C to 140°C. The material data is compared with tensile specimens deposited on the surface of a FR4 substrate.
  • Keywords
    copper; electrodeposition; electroplating; printed circuit manufacture; resins; tensile testing; thermal expansion; Cu; FR4 substrate; base material; copper barrel; copper layers; electrodeposition; electroplating; epoxy resin; material properties; stress-strain curves; temperature 20 C to 140 C; Copper; Material properties; Rough surfaces; Surface roughness; Surface treatment; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-2832-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2013.6745678
  • Filename
    6745678