• DocumentCode
    693351
  • Title

    Morphology control of LiCoO2 thin film prepared by pulsed laser deposition

  • Author

    Desheng Liu ; Yun Chao ; Shengnan Wu ; Shuying Zhong ; Minsheng Lei

  • Author_Institution
    Dept. of Mech. & Electr. Eng., Jiangxi Univ. of Sci. & Technol., Nanchang, China
  • Volume
    2
  • fYear
    2014
  • fDate
    19-21 Aug. 2014
  • Firstpage
    529
  • Lastpage
    531
  • Abstract
    LiCoO2 thin film samples have been prepared by pulsed laser deposition under different deposition conditions. A series of tests have been done to investigate the relationship between the film quality and the deposition conditions. The results from XRD show that the LiCoO2 films deposited by PLD thermodynamically tend to form (003) preferred orientation. But the films grown at high repetition rate (35Hz) and low oxygen pressure (1Pa) show a random orientation. SEM and AFM images reveal that the size and uniformity of LiCoO2 crystalline grains is directly depends on the deposition temperature and repetition rate. Therefore, by adjusting the deposition parameters, to achieve the purpose of LiCoO2 thin film morphology control is feasible.
  • Keywords
    atomic force microscopy; grain size; lithium compounds; pulsed laser deposition; scanning electron microscopy; texture; thin films; (003) preferred orientation; AFM image; LiCoO2; SEM image; XRD; crystalline grain size; crystalline grain uniformity; deposition temperature; film quality; frequency 35 Hz; oxygen pressure; pressure 1 Pa; pulsed laser deposition; random orientation; repetition rate; thin film morphology control; Films; Plasma temperature; Pulsed laser deposition; Substrates; Surface morphology; Surface treatment; X-ray scattering; Cathode Materials; LiCoO2; Pulsed Laser Deposition; Thin-film Batteries;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Materials for Renewable Energy and Environment (ICMREE), 2013 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4799-3335-8
  • Type

    conf

  • DOI
    10.1109/ICMREE.2013.6893727
  • Filename
    6893727