Feature selection for Alternate Test using wrappers: Application to an RF LNA case study

Testing analog, mixed-signal and RF circuits represents the main cost component for testing complex SoCs. A promising solution to alleviate this cost is the Alternate Test strategy. Alternate test is an indirect test approach that replaces costly specification measurements by simpler signatures. Machine learning techniques are then used to map signatures and performances. One key point that still remains as an open problem is the conception of adequate simple measurement candidates. This work presents efficient algorithms for selecting information rich signatures.