• DocumentCode
    706694
  • Title

    Monitoring in semiconductor manufacturing: A contribution to diagnosis in complex computer systems

  • Author

    Kotte, Gerolf ; Kabitzsch, Klaus

  • Author_Institution
    Systema GmbH, Klipphausen, Germany
  • fYear
    1999
  • fDate
    Aug. 31 1999-Sept. 3 1999
  • Firstpage
    2154
  • Lastpage
    2159
  • Abstract
    Today´s computer environments move toward higher complexity. The expansion of the local networks, the need for heterogeneous software and hardware, and the various interfaces between them, bring new challenges into computer science. The requirements for availability and reliability 24 hours per day and 7 days per week let increase the system administrator´s effort needed. Highest flexibility and self organising raises the software overall performance and is taylored to the customer´s needs in the best way possible. However, it also raises a lot of new issues in the field of tracing, trouble-shooting and fault diagnosis.
  • Keywords
    fault diagnosis; reliability; semiconductor industry; fault diagnosis; reliability; semiconductor manufacturing monitoring; system administrator effort; Computers; Hardware; Manufacturing; Monitoring; Production facilities; Servers; Software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Conference (ECC), 1999 European
  • Conference_Location
    Karlsruhe
  • Print_ISBN
    978-3-9524173-5-5
  • Type

    conf

  • Filename
    7099638