• DocumentCode
    708936
  • Title

    A study on an approach for analysing test basis using I/O test data patterns

  • Author

    Yumoto, Tsuyoshi ; Matsuodani, Tohru ; Tsuda, Kazuhiko

  • Author_Institution
    Hewlett-Packard Japan, Ltd., Tokyo, Japan
  • fYear
    2015
  • fDate
    13-17 April 2015
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    For software testing, it is important to derive test cases without lacking or duplication before test execution. Test basis to be analysed in test development process for black box testing is a functional specification. And it is less analysed under consistency rules. As a result, this has the potential to cause the lacking or duplication of test cases. This paper proposes an approach for analysing test basis focusing on data I/O in test execution to achieve analysing test basis can be more comprehensive. Moreover, in order to demonstrate this approach, an experiment is performed comparing with test cases in a real project.
  • Keywords
    program testing; black box testing; consistency rule; functional specification; software testing; test development process; test execution; Conferences; Periodic structures; Reflection; Resource management; Software; Software testing; I/O test data patterns; Test-Categories; software testing; test analysis; test condition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Testing, Verification and Validation Workshops (ICSTW), 2015 IEEE Eighth International Conference on
  • Conference_Location
    Graz
  • Type

    conf

  • DOI
    10.1109/ICSTW.2015.7107429
  • Filename
    7107429