DocumentCode
709032
Title
2D imaging system with optical tracking for EMI source localization
Author
Hui He ; Khilkevich, Victor ; Pommerenke, David
Author_Institution
Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear
2015
fDate
15-21 March 2015
Firstpage
107
Lastpage
110
Abstract
This research presents a 2D imaging system with optical tracking to localize radiating sources. Optical tracking system is used for localizing the position of the near field measurement probe. Emission source microscopy (ESM) algorithm derived from synthetic aperture radar (SAR) technique is used to localize radiating sources.
Keywords
electric noise measurement; electromagnetic interference; infrared imaging; optical tracking; 2D imaging system; EMI source localization; emission source microscopy algorithm; near field measurement probe; optical tracking system; radiating source localization; synthetic aperture radar technique; Antenna measurements; Electromagnetic interference; Image reconstruction; Optical imaging; Optical reflection; Synthetic aperture radar; Transmission line measurements; EMI; ESM; SAR; near-field scanning; optical tracking; source localization;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on
Conference_Location
Santa Clara, CA
Print_ISBN
978-1-4799-1992-5
Type
conf
DOI
10.1109/EMCSI.2015.7107668
Filename
7107668
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