• DocumentCode
    709600
  • Title

    The application of Cu-Ag submicron composite particles in microelectronic bonding

  • Author

    Ching-Huan Hsiao ; Jia-Shin Wu ; Chi-Hang Tsai ; Shih-Yun Chen ; Jenn-Ming Song

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Chung Hsing Univ., Taichung, Taiwan
  • fYear
    2015
  • fDate
    14-17 April 2015
  • Firstpage
    248
  • Lastpage
    251
  • Abstract
    In this study, Cu-Ag composite pastes with the mixture of Cu@Ag core-shell particles and Ag nanoparticles prepared by one-step spray pyrolysis are developed for microelectronic bonding applications. Cu to Cu bonding can be successfully achieved by thermal compression with the Cu/Ag pastes at 250°C. The joint strength reaches 28.2 MPa and 32.4MPa respectively when bonding pressure holds at 5 MPa and 10MPa at 275°C. It has been demonstrated the joints thus formed remain robust at elevated temperatures up to 250°C and excellent reliability subjected to thermal cycling ranged from -65 °C~150 °C.
  • Keywords
    bonding processes; composite particles; copper; electrical conductivity; nanoparticles; pyrolysis; silver; thermal stress cracking; CuAg; composite pastes; core-shell particles; microelectronic bonding; nanoparticles; one-step spray pyrolysis; pressure 10 MPa; pressure 5 MPa; submicron composite particles; temperature 250 degC; temperature 275 degC; thermal compression; thermal cycling; Bonding; Joints; Nanoparticles; Resistance; Surface morphology; Temperature distribution; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging and iMAPS All Asia Conference (ICEP-IACC), 2015 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-9040-9012-1
  • Type

    conf

  • DOI
    10.1109/ICEP-IAAC.2015.7111032
  • Filename
    7111032