DocumentCode
715908
Title
A practical approach for logic simplification based on fault acceptability for error tolerant application
Author
Ichihara, Hideyuki ; Kamei, Junpei ; Iwagaki, Tsuyoshi ; Inoue, Tomoo
Author_Institution
Grad. Sch. of Inf. Sci., Hiroshima City Univ., Hiroshima, Japan
fYear
2015
fDate
25-29 May 2015
Firstpage
1
Lastpage
2
Abstract
In this paper, we focus on fault-acceptability-based logic simplification for error tolerant application. We propose a practical (or cost-effective) logic simplification algorithm. The proposed algorithm (1) avoids acceptability identification for faults that are potentially unacceptable and (2) isolates redundancy identification procedure from acceptability identification. Experimental results show that, compared with a previous algorithm, the proposed algorithm can reduce the computational effort without losing the ability of logic simplification.
Keywords
integrated circuit testing; logic testing; redundancy; acceptability identification; error tolerant application; fault acceptability; logic simplification algorithm; redundancy identification procedure; Circuit faults; Cities and towns; Combinational circuits; Fault diagnosis; Redundancy; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2015 20th IEEE European
Conference_Location
Cluj-Napoca
Type
conf
DOI
10.1109/ETS.2015.7138727
Filename
7138727
Link To Document