• DocumentCode
    715934
  • Title

    LSI aging estimation using ring oscillators

  • Author

    Miura, Yukiya ; Ikeda, Tatsunori

  • Author_Institution
    Fac. of Syst. Design, Tokyo Metropolitan Univ., Tokyo, Japan
  • fYear
    2015
  • fDate
    25-29 May 2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Transistor aging occurs in nanoscale technologies and is one of the factors that degrade the performance of LSIs. This paper presents a method for estimating the amount of increment in the delay time of an LSI and a method for estimating the amount of increment in the threshold voltage per transistor from the changes in the period of two ring oscillators by aging.
  • Keywords
    ageing; large scale integration; nanotechnology; oscillators; transistors; LSI aging estimation; nanoscale technologies; ring oscillators; transistor aging; Aging; Delays; Estimation; Field effect transistors; Large scale integration; Logic gates; MOS devices; Aging (Degradation); CHC; Delay time; NBTI; PBTI; Ring oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2015 20th IEEE European
  • Conference_Location
    Cluj-Napoca
  • Type

    conf

  • DOI
    10.1109/ETS.2015.7138765
  • Filename
    7138765
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=715934