• DocumentCode
    718773
  • Title

    Influence of an initial chemical state of cation impurities on their diffusion in ionic crystals

  • Author

    Ghyngazov, S.A. ; Frangulyan, T.S. ; Chernyavskii, A.V.

  • Author_Institution
    Inst. of Non-Destruct. Testing, Nat. Res. Tomsk Polytech. Univ., Tomsk, Russia
  • fYear
    2015
  • fDate
    21-23 May 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Depth profiles of magnesium, fluorine and oxygen impurities was examined in the surface layers of alkali-halide crystals using method of secondary ion mass spectrometry. Samples of potassium bromide, coated with a surface film of magnesium fluoride were subjected to isothermal diffusion annealing in air at various times. It is shown that the diffusion of O ions occurs from the ambient atmosphere besides the diffusion of Mg and F ions during annealing of KBr crystals. Accurate estimation of the diffusion coefficients of cationic impurity Mg requires taking into account the possible interaction of this impurity and oxygen. The effect of an intensive electron beam on diffusion of magnesium impurity in crystals of fluoride of lithium is studied.
  • Keywords
    annealing; fluorine; impurities; magnesium; magnesium compounds; oxygen; potassium compounds; secondary ion mass spectra; thin films; KBr crystal annealing; KBr:F; KBr:Mg; KBr:O; alkali-halide crystals; cation impurities; cationic impurity; chemical state; depth profiles; diffusion coefficients; fluorine impurities; ionic crystals; isothermal diffusion annealing; magnesium fluoride; magnesium impurity diffusion; oxygen impurities; potassium bromide; secondary ion mass spectrometry; surface film; surface layers; Annealing; Crystals; Films; Impurities; Ions; Magnesium; Surface treatment; alkali-halide crystals; diffusion; secondary ion mass spectrometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Communications (SIBCON), 2015 International Siberian Conference on
  • Conference_Location
    Omsk
  • Print_ISBN
    978-1-4799-7102-2
  • Type

    conf

  • DOI
    10.1109/SIBCON.2015.7147277
  • Filename
    7147277