DocumentCode
719560
Title
RAM apportionment model for Mass Rapid Transit Systems
Author
Pandey, Ajeet Kumar ; Goyal, Praveen ; Agarwal, Ankur Mohan
Author_Institution
Alstom Transp. India Ltd., Bangalore, India
fYear
2015
fDate
28-30 May 2015
Firstpage
6
Lastpage
11
Abstract
Due to the rapid urbanization, rising travel needs and accessibility, Metro Rail becomes one of the preferred modes of transport for commuters. A safe and reliable Metro System with specified reliability, availability, maintainability and safety (RAMS) requirements are of prime concern. RAMS requirements can be clubbed together to derive service punctuality which can be seen as the core KPI (Key Performance Indicator of the Mass Rapid Transit Systems (MRTS). Service punctuality is tightly coupled with the RAM requirements and therefore shall be specified cautiously. Once the KPI has been specified, the next step is to decide the RAM requirements of various subsystems to meet or exceed the specified KPI target. In other words, the system punctuality target is translated in the terms of Reliability, Availability, and Maintainability at system and subsystems level. This paper presents a top-down RAM apportionment model for generic MRTS systems. The proposed model endorses the system level KPI by translating and apportioning the system level RAM requirements into requirements for each subsystem, equipment or component. As a case study, the proposed model has been applied to one of key Metro Rail Project and its various subsystems in India. Methods for deriving mean time between failures (MTBF), mean time to repair (MTTR) and % availability of all systems are also discussed.
Keywords
maintenance engineering; rapid transit systems; reliability; safety; India; KPI; MTBF; MTTR; Metro Rail Project; RAM apportionment model; RAMS requirements; key performance indicator; mass rapid transit system; mean time between failures; mean time to repair; reliability-availability-maintainability-safety requirements; service punctuality; system availability; Delays; Industries; Random access memory; Reliability; Safety; apportionment; availability; maintainability &safety (RAMS); mean time between service affecting failures; metro rail; punctuality; reliability; service affecting failure;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Instrumentation and Control (ICIC), 2015 International Conference on
Conference_Location
Pune
Type
conf
DOI
10.1109/IIC.2015.7150582
Filename
7150582
Link To Document