• DocumentCode
    719939
  • Title

    An automatic voltage disturbance classification system based on Clonal Selection Algorithm

  • Author

    Willian de Souza Arruda, Bruno ; Silverio Freire, Raimundo Carlos ; Protasio de Souza, Cleonilson

  • Author_Institution
    Dept. of Electr. Eng., Fed. Univ. of Campina Grande-UFCG, Paraíba, Brazil
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    121
  • Lastpage
    126
  • Abstract
    Classification of voltage disturbances in power systems is essential for modern society and can be very demanding according to the used method or the aimed accuracy. This paper presents a new intelligent approach aimed to automatically analyse power quality disturbances including sag, swell, outage, harmonics and normal waveform. The approach is based on Artificial Immune System and focuses on the application of a Clonal Selection Algorithm to extract features from disturbance waveforms and classify the disturbances in each 0.5 cycle of the fundamental frequency. Other important feature of the proposed approach is that it can be embedded since the resulted on-line classification tool achieves very low computational complexity. Comparisons and experimental results obtained from the application of the proposed method validate the approach and achieved a classification accuracy at least better than previous work.
  • Keywords
    feature extraction; power supply quality; power system harmonics; signal classification; artificial immune system; automatic voltage disturbance classification; clonal selection algorithm; feature extraction; power quality disturbances; power system harmonics; power systems; voltage outage; voltage sag; voltage swell; Adaptive systems; Cloning; Computational complexity; Harmonic analysis; Histograms; Immune system; Power quality; Clonal Selection Algorithm; Disturbances; Power Quality; classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151251
  • Filename
    7151251