DocumentCode
720758
Title
Computational techniques to incorporate shot count reduction into inverse lithography
Author
Xiaofei Wu ; Shiyuan Liu ; Lam, Edmund Y.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
fYear
2015
fDate
15-16 March 2015
Firstpage
1
Lastpage
3
Abstract
We develop an inverse lithography method to tackle the shot count minimization in mask fracturing. The shot count minimization in model based fracturing is considered as a problem of finding a sparse combination of basis functions for the mask patterns, where the basis functions are defined as rectangles corresponding to the shots. This problem is formulated as a nonlinear least square problem, and a Gauss-Newton algorithm is proposed to solve it. The algorithm is modified to promote sparsity to reduce the shot count. Preliminary results of mask fracturing using the proposed algorithm is shown, and it is also incorporated into inverse lithography to show its effectiveness to reduce shot count.
Keywords
Gaussian distribution; Newton method; least squares approximations; lithography; masks; Gauss-Newton algorithm; basis functions; computational techniques; inverse lithography; mask fracturing; mask patterns; nonlinear least square problem; shot count minimization; shot count reduction; sparse combination; Amplitude shift keying; Computed tomography; Minimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Technology International Conference (CSTIC), 2015 China
Conference_Location
Shanghai
ISSN
2158-2297
Type
conf
DOI
10.1109/CSTIC.2015.7153342
Filename
7153342
Link To Document