• DocumentCode
    720758
  • Title

    Computational techniques to incorporate shot count reduction into inverse lithography

  • Author

    Xiaofei Wu ; Shiyuan Liu ; Lam, Edmund Y.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
  • fYear
    2015
  • fDate
    15-16 March 2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We develop an inverse lithography method to tackle the shot count minimization in mask fracturing. The shot count minimization in model based fracturing is considered as a problem of finding a sparse combination of basis functions for the mask patterns, where the basis functions are defined as rectangles corresponding to the shots. This problem is formulated as a nonlinear least square problem, and a Gauss-Newton algorithm is proposed to solve it. The algorithm is modified to promote sparsity to reduce the shot count. Preliminary results of mask fracturing using the proposed algorithm is shown, and it is also incorporated into inverse lithography to show its effectiveness to reduce shot count.
  • Keywords
    Gaussian distribution; Newton method; least squares approximations; lithography; masks; Gauss-Newton algorithm; basis functions; computational techniques; inverse lithography; mask fracturing; mask patterns; nonlinear least square problem; shot count minimization; shot count reduction; sparse combination; Amplitude shift keying; Computed tomography; Minimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Technology International Conference (CSTIC), 2015 China
  • Conference_Location
    Shanghai
  • ISSN
    2158-2297
  • Type

    conf

  • DOI
    10.1109/CSTIC.2015.7153342
  • Filename
    7153342