DocumentCode
721589
Title
Growth of phase pure yttrium iron garnet thin films on silicon: The effect of substrate and post deposition annealing temperatures
Author
Zhang, Y. ; Xie, J. ; Deng, L. ; Bi, L.
Author_Institution
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2015
fDate
11-15 May 2015
Firstpage
1
Lastpage
1
Abstract
Recently, monolithic integration of yttrium iron garnet (YIG) on silicon has attracted significant research interest both for photonic and spintronic applications. Growing phase pure, high magnetization YIG thin films on silicon is still a challenging quest. So far, different deposition and annealing conditions have been reported from different groups, leading to YIG thin films with different magnetic properties.[1-4] A systematic study on the growth condition on integrating a phase pure YIG thin film on silicon is lack. In this study, we systematically studied the effect of substrate temperature (Tsub) and post deposition annealing temperatures (Tannl) on growing phase pure YIG thin films on silicon. The results show that the deposition substrate temperature is critical for maintaining the YIG material stoichiometry; while the rapid thermal annealing (RTA) temperature is important for achieving phase purity and high saturation magnetization (Ms). Both the deposition temperature and RTA temperature are important for growing phase pure YIG on silicon.
Keywords
garnets; iron compounds; magnetic thin films; magnetisation; rapid thermal annealing; silicon; stoichiometry; yttrium compounds; Y3Fe5O12; high magnetization YIG thin film; monolithic integration; phase pure yttrium iron garnet thin films; phase purity; post deposition annealing temperature; rapid thermal annealing; saturation magnetization; stoichiometry; substrate; Annealing; Films; Iron; Silicon; Substrates; X-ray scattering; Yttrium;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4799-7321-7
Type
conf
DOI
10.1109/INTMAG.2015.7156746
Filename
7156746
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