DocumentCode
723221
Title
Empirical investigations on die edge defects reductions in die singulation processes for glass-panel based interposers for advanced packaging
Author
Wei, Frank ; Sundaram, Venkatesh ; McCann, Scott ; Smet, Vanessa ; Tummala, Rao
Author_Institution
DISCO Corp., Tokyo, Japan
fYear
2015
fDate
26-29 May 2015
Firstpage
1991
Lastpage
1996
Abstract
The authors evaluated various dicing methods in order to improve the TCT reliability against SeWaRe type of failures in glass interposers fabricated by polymer lamination over thin glass sheet cores. For blade-based dicing methods, the criteria for down-selection were (i) the least glass sidewall roughness and (ii) crack-free die edge visual inspections. In this fashion, a BKM dicing blade was identified that produced SeWaRe-free interposer dies upon dicing operations. Secondly, in order to compare the fracture strengths of glass produced by blade dicing with those of known methods, bare, thin glass sheet test specimens were made. In 2-point bending fracture strengths tests, glass strengths from three different blade dicing methods are similar to other score-and-break based separation methods. Lastly, a dicing process using a R&D laser system from DISCO Corp., which is not yet released-to-market, also successfully singulated the glass interposer samples. Samples produced by both blade and laser processes have been passing the TCT accelerated reliability tests.
Keywords
bending; blades; fracture toughness testing; glass; laser beam cutting; packaging; polymers; thermal analysis; BKM dicing blade; DISCO Corp; R&D laser system; SeWaRe type; SeWaRe-free interposer dies; TCT reliability; bending fracture strengths tests; blade-based dicing methods; crack-free die edge visual inspections; die edge defect reductions; die singulation processes; glass interposers; glass sheet cores; glass sidewall roughness; glass-panel; laser processes; packaging; polymer lamination; score-and-break based separation methods; thermal cycle test; thin glass sheet test specimens; Blades; Fabrication; Glass; Inspection; Laser beam cutting; Polymers; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location
San Diego, CA
Type
conf
DOI
10.1109/ECTC.2015.7159875
Filename
7159875
Link To Document