• DocumentCode
    723252
  • Title

    Demonstration of ultra-thin tantalum capacitors on silicon substrates for high-frequency and high-efficiency power applications

  • Author

    Chakraborti, Parthasarathi ; Gandhi, Saumya ; Sharma, Himani ; Raj, P.M. ; Rataj, Kamil-Paul ; Tummala, Rao

  • Author_Institution
    3D Syst. Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    2254
  • Lastpage
    2258
  • Abstract
    This paper describes an innovative scheme for integrating thinfilm tantalum (Ta) capacitors on active silicon substrates, an approach that can serve as a roadmap for the potential integration of ultra-thin high density capacitors in near future. The paper describes a new 3D concept for ultra-miniaturized, multi-functional and relatively low-cost power converter modules. The scheme consists of planar tantalum (Ta) capacitors by forming Ta2O5 (30-120 nm thick) dielectric and attaching directly to active or passive Si substrates using ultra-loss dielectrics (Zeon, ZS-100). Capacitors attached directly on Si allow for shorter interconnection length (<; 10μm) yielding lower parasitics in loop inductance and planar resistance. Reducing these parasitics results in higher switching frequency (>100 MHz) with fewer Ta capacitors on active Si. The paper focuses on capacitor fabrication of ultra-thin Ta foils (<; 5μm) and their integration on ultra-thin active Si for lowering the parasitics. Consequently, electrical characterization of the above capacitors demonstrates the fundamental electrical superiority of the 3D integrated Ta capacitors.
  • Keywords
    elemental semiconductors; power capacitors; power convertors; power semiconductor devices; semiconductor device manufacture; semiconductor thin films; silicon; tantalum; thin film capacitors; Si; Ta; Ta2O5; ZS-100; Zeon; capacitor fabrication; passive substrates; power converter modules; size 30 nm to 120 nm; thin film capacitors; ultra-loss dielectrics; ultra-thin foils; ultra-thin tantalum capacitors; Capacitance; Capacitors; Copper; Leakage currents; Polymers; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159917
  • Filename
    7159917