Novel components for a fully automated PIM and S-Parameter test system

As the spectrum utilization in modern mobile communication systems increases steadily, noise created by passive intermodulation becomes more likely. Thus passive intermodulation measurements are an obligatory part in the production of components for mobile communication infrastructure. However, these measurements are time-consuming and also costly. This paper describes a measurement system that reduces testing time by combination of S-Parameter and PIM measurements as well as automatic connecting of the device under test (DUT) to the test port.