Walking a thin line - performance and quality grading vs. yield overcut

Product engineers are continually working to balance product cost, schedules and quality. A significant contributor to all three dimensions is enabling the appropriate test coverage to provide the required quality levels while minimizing yield overcut. This challenge is magnified by complexities created by advanced power management and the need for performance grading across various power states. This talk will describe these challenges and approaches that AMD is taking to address them.