• DocumentCode
    726312
  • Title

    Security analysis of automotive architectures using probabilistic model checking

  • Author

    Mundhenk, Philipp ; Steinhorst, Sebastian ; Lukasiewycz, Martin ; Fahmy, Suhaib A. ; Chakraborty, Samarjit

  • Author_Institution
    TUM CREATE, Singapore, Singapore
  • fYear
    2015
  • fDate
    8-12 June 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper proposes a novel approach to security analysis of automotive architectures at the system-level. With an increasing amount of software and connectedness of cars, security challenges are emerging in the automotive domain. Our proposed approach enables assessment of the security of architecture variants and can be used by decision makers in the design process. First, the automotive Electronic Control Units (ECUs) and networks are modelled at the system-level using parameters per component, including an exploitability score and patching rates that are derived from an automated or manual assessment. For any specific architecture variant, a Continuous-Time Markov Chain (CTMC) model is determined and analyzed in terms of confidentiality, integrity and availability, using probabilistic model checking. The introduced case study demonstrates the applicability of our approach, enabling, for instance, the exploration of parameters like patch rate targets for ECU manufacturers.
  • Keywords
    Markov processes; automotive engineering; decision making; design engineering; formal verification; probability; security of data; software architecture; CTMC model; ECU; architecture variants; automotive architectures; continuous-time Markov chain; decision making; design process; electronic control units; probabilistic model checking; security analysis; Analytical models; Automotive engineering; Computer architecture; Markov processes; Probabilistic logic; Security; Telematics; Automotive; Model checking; Networks; Security;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2744769.2744906
  • Filename
    7167222