• DocumentCode
    726327
  • Title

    Hybrid Quick Error Detection (H-QED): Accelerator validation and debug using high-level synthesis principles

  • Author

    Campbell, Keith A. ; Lin, David ; Mitra, Subhasish ; Chen, Deming

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2015
  • fDate
    8-12 June 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Post-silicon validation and debug challenges of system-on-chips (SoCs) are getting increasingly difficult. As we reach the limits of Dennard scaling, efforts to improve system performance and energy efficiency have resulted in the integration of a wide variety of complex hardware accelerators in SoCs. Hence, it is essential to address post-silicon validation and debug of hardware accelerators. High-level synthesis (HLS) is a promising technique to rapidly create customized hardware accelerators. In this paper, we present the Hybrid Quick Error Detection (H-QED) approach that overcomes post-silicon validation and debug challenges for hardware accelerators by leveraging HLS techniques. H-QED improves error detection latencies (time elapsed from when a bug is activated to when it manifests as an observable failure) by 2 orders of magnitude and bug coverage 3-fold compared to traditional post-silicon validation techniques. H-QED also uncovered previously unknown bugs in the CHStone benchmark suite, which is widely used by the HLS community. H-QED incurs less than 2% chip-level area overhead with negligible performance impact, and we also introduce techniques to minimize any possible intrusiveness introduced by H-QED.
  • Keywords
    error detection; integrated circuit reliability; performance evaluation; system-on-chip; CHStone benchmark suite; Dennard scaling; H-QED approach; HLS technique; SoC; hardware accelerator validation; high-level synthesis principle; hybrid quick error detection approach; post-silicon validation technique; system performance improvement; system-on-chip; Benchmark testing; Computer bugs; Hardware; Probes; Software; System-on-chip; Timing; C simulation; Post-silicon validation; accelerators; high-level synthesis; logic bugs; signature generation; timing errors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2744769.2744853
  • Filename
    7167237