• DocumentCode
    726374
  • Title

    EnAAM: Energy-efficient anti-aging for on-chip video memories

  • Author

    Shafique, Muhammad ; Khan, Muhammad Usman Karim ; Tufek, Orcun ; Henkel, Jorg

  • Author_Institution
    Embedded Syst., Karlsruhe Inst. of Technol., Karlsruhe, Germany
  • fYear
    2015
  • fDate
    8-12 June 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Negative Biased Temperature Instability-induced aging has emerged as one of the critical reliability threats in the nano-era. In this paper, we propose a microarchitectural-level technique for mitigating aging of on-chip SRAM-based memories. The goal is to achieve balanced aging of all memory cells at minimal energy overhead, leading to a longer lifetime. For a configurable and energy-efficient design, we perform aging and energy analysis of different aging balancing circuits. This analysis is leveraged to design a novel energy-efficient anti-aging memory architecture. Our architecture employs a configurable anti-aging controller that leverages the data characteristics to dynamically select (1) at what time instant the aging balancing circuit should be activated, and (2) on which SRAM cells aging balancing should be applied. Our experiments demonstrate significant aging improvements while providing up to 30% energy savings.
  • Keywords
    SRAM chips; integrated circuit design; integrated circuit reliability; memory architecture; power aware computing; EnAAM; SRAM cells aging balancing; aging balancing circuits; antiaging analysis; configurable antiaging controller; data characteristics; energy overhead; energy-efficient antiaging memory architecture; microarchitectural-level technique; negative biased temperature instability-induced aging; on-chip SRAM-based memories; on-chip video memories; reliability threats; Aging; Inverters; SRAM cells; Streaming media; Switches; System-on-chip; Transducers; Aging; Energy; Low-Power; Memory; Reliability; Video;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2744769.2744834
  • Filename
    7167285