DocumentCode
726441
Title
mTunes: Efficient post-silicon tuning of mixed-signal/RF integrated circuits based on Markov decision process
Author
Zaheer, Manzil ; Fa Wang ; Chenjie Gu ; Xin Li
Author_Institution
ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2015
fDate
8-12 June 2015
Firstpage
1
Lastpage
6
Abstract
Uncertainty prevails in IC manufacturing and circuit operation. In particular, process variability has a huge impact on circuit performance, especially for mixed-signal/RF circuits, leading to unacceptable yields. Additionally, environmental uncertainties, such as temperature fluctuation and channel variation, further deteriorate performances in field. To combat variability, circuits are often made reconfigurable by adding tunable knobs to recover circuit performance in the post-manufacturing stage. However, as the number of knobs increases, knob tuning becomes challenging due to the huge search space. In fact, knob-tuning policies can have an observable impact on final performance and power consumption. In this paper, we propose mTunes, a method based on the Markov decision process for dynamically choosing the “right” knob tuning sub-routine from a pre-defined set achieving a balance between performance and power constraints. The proposed method has been applied to a reconfigurable RF front-end design, showing 60% improvement in yield compared to static tuning policies.
Keywords
Markov processes; circuit tuning; elemental semiconductors; integrated circuit manufacture; integrated circuit modelling; low-power electronics; mixed analogue-digital integrated circuits; power consumption; radiofrequency integrated circuits; silicon; IC manufacturing; Markov decision process; Si; channel variation; circuit operation; knob tuning subroutine; knob-tuning policies; mixed-signal-RF integrated circuits; post-silicon tuning; power constraints; power consumption; reconfigurable RF front-end design; static tuning policies; temperature fluctuation; tunable knobs; Algorithm design and analysis; Integrated circuit modeling; Markov processes; Measurement; Power demand; Radio frequency; Tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
Conference_Location
San Francisco, CA
Type
conf
DOI
10.1145/2744769.2744873
Filename
7167356
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