• DocumentCode
    72724
  • Title

    Stochastic Analysis of Wideband Near-Field Emissions From Dipole Antennas and Integrated Circuits

  • Author

    Arnaut, L.R. ; Obiekezie, C.S.

  • Author_Institution
    George Green Inst. of Electromagn. Res., Univ. of Nottingham, Nottingham, UK
  • Volume
    56
  • Issue
    1
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    93
  • Lastpage
    101
  • Abstract
    A statistical method is developed for characterizing wideband emissions from planar antennas and circuits containing multiple radiating elements. It is shown how the space-time and space-frequency correlation functions for source currents can be deduced from near-field measurements. These correlations produce additional spectral distortion of the emitted near field, over and above the far-field spectra of individual elements and their combined spectrum for uncorrelated sources. For an arbitrary configuration and number of emitting dipoles, the contribution to this distortion by pairwise correlations is fully calculable from the second-order covariance theory. Simulation results for a 2 ×2 dipole array and near-field measurements on an L-shaped microstrip antenna with wide-band excitation demonstrate and validate the feasibility of the method and the theoretically predicted spectral distortion based on pairwise correlations only.
  • Keywords
    ULSI; dipole antenna arrays; distortion; electromagnetic field theory; planar antenna arrays; statistical analysis; stochastic processes; L-shaped microstrip antenna; ULSI; dipole antenna array; emitting dipole number; far-field spectra; integrated circuits; multiple radiating elements; near-field measurements; pairwise correlations; planar antennas; second-order covariance theory; source currents; space-frequency correlation functions; space-time correlation functions; spectral distortion; statistical method; stochastic analysis; wideband excitation; wideband near-field emissions; Correlation; Distortion measurement; Integrated circuit modeling; Interference; Noise measurement; Stochastic processes; Circular fields; correlation analysis; near-field coherence; signal integrity; spectral distortion; stochastic electromagnetic fields;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2013.2273737
  • Filename
    6575113