• DocumentCode
    728493
  • Title

    Bayesian nonparametric set construction for robust optimization

  • Author

    Campbell, Trevor ; How, Jonathan P.

  • Author_Institution
    Lab. for Inf. & Decision Syst., MIT, Cambridge, MA, USA
  • fYear
    2015
  • fDate
    1-3 July 2015
  • Firstpage
    4216
  • Lastpage
    4221
  • Abstract
    This paper presents a Bayesian nonparametric, data-driven, nonconvex uncertainty set construction for robust optimization. First, a basic uncertainty set is constructed from a union of posterior predictive ellipsoids for the Dirichlet process Gaussian mixture. The robustification of linear optimization problems using this set is proven to be a tractable second order cone problem with probabilistic feasibility guarantees. Noting that this basic set is typically overly conservative, a scaled version of the set is obtained via stochastic bisection search, and convergence guarantees to the least conservative scaled set for a particular probabilistic guarantee are provided. Experiments on synthetic linear programs and a Mobility on Demand system design problem demonstrate that the proposed set improves upon the robust optimal objective over simpler uncertainty sets, more accurately achieves the desired level of conservatism, and requires little design input from the user.
  • Keywords
    Bayes methods; Gaussian processes; convergence; linear programming; mixture models; search problems; set theory; stochastic programming; Bayesian nonparametric set construction; Dirichlet process Gaussian mixture; convergence; data-driven set construction; linear optimization problems; mobility on demand system design problem; nonconvex uncertainty set construction; posterior predictive ellipsoids; probabilistic feasibility guarantees; probabilistic guarantee; robust optimization; stochastic bisection search; synthetic linear programs; tractable second order cone problem; Bayes methods; Optimization; Probabilistic logic; Robustness; Shape; Uncertainty; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2015
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4799-8685-9
  • Type

    conf

  • DOI
    10.1109/ACC.2015.7171991
  • Filename
    7171991