• DocumentCode
    729003
  • Title

    Entailment among Probabilistic Implications

  • Author

    Atserias, Albert ; Balcazar, Jose L.

  • Author_Institution
    Dept. of Comput. Sci., Univ. Politec. de Catalunya, Barcelona, Spain
  • fYear
    2015
  • fDate
    6-10 July 2015
  • Firstpage
    621
  • Lastpage
    632
  • Abstract
    We study a natural variant of the implicational fragment of propositional logic. Its formulas are pairs of conjunctions of positive literals, related together by an implicational-like connective, the semantics of this sort of implication is defined in terms of a threshold on a conditional probability of the consequent, given the antecedent: we are dealing with what the data analysis community calls confidence of partial implications or association rules. Existing studies of redundancy among these partial implications have characterized so far only entailment from one premise and entailment from two premises. By exploiting a previously noted alternative view of this entailment in terms of linear programming duality, we characterize exactly the cases of entailment from arbitrary numbers of premises. As a result, we obtain decision algorithms of better complexity, additionally, for each potential case of entailment, we identify a critical confidence threshold and show that it is, actually, intrinsic to each set of premises and antecedent of the conclusion.
  • Keywords
    data mining; duality (mathematics); formal logic; linear programming; probability; association rules; conditional probability; confidence of partial implications; critical confidence threshold; implicational-like connective; linear programming duality; probabilistic implications; propositional logic; Communities; Context; Data analysis; Linear programming; Probabilistic logic; Redundancy; Semantics; conditional probability; confidence threshold; linear programming; partial implication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Logic in Computer Science (LICS), 2015 30th Annual ACM/IEEE Symposium on
  • Conference_Location
    Kyoto
  • ISSN
    1043-6871
  • Type

    conf

  • DOI
    10.1109/LICS.2015.63
  • Filename
    7174917