• DocumentCode
    73011
  • Title

    Application-Specific Wear Leveling for Extending Lifetime of Phase Change Memory in Embedded Systems

  • Author

    Duo Liu ; Tianzheng Wang ; Yi Wang ; Zili Shao ; Qingfeng Zhuge ; Sha, Edwin H-M

  • Author_Institution
    Coll. of Comput. Sci., Chongqing Univ., Chongqing, China
  • Volume
    33
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    1450
  • Lastpage
    1462
  • Abstract
    Phase change memory (PCM) has been proposed to replace NOR flash and DRAM in embedded systems because of its attractive features. However, the endurance of PCM greatly limits its adoption in embedded systems. As most embedded systems are application-oriented, we can tackle the endurance problem of PCM by exploring application-specific features such as fixed access patterns and update frequencies. In this paper, we propose an application-specific wear leveling technique, called Curling-PCM, to evenly distribute write activities across the whole PCM chip to improve the endurance of PCM in embedded systems. The basic idea is to exploit application-specific features in embedded systems and periodically move the hot region across the whole PCM chip. To reduce the overhead of moving the hot region and improve the performance of PCM-based embedded systems, a fine-grained partial wear leveling policy is proposed for Curling-PCM, by which only part of the hot region is moved during each request handling period. Experimental results show that Curling-PCM can effectively evenly distribute write traffic for a prime application of PCM in embedded systems. We expect this paper can serve as a first step toward the full exploration of application-specific features in PCM-based embedded systems.
  • Keywords
    application specific integrated circuits; embedded systems; phase change memories; Curling-PCM; DRAM; NOR flash; application-specific wear leveling technique; embedded system; fine-grained partial wear leveling policy; fixed access pattern; overhead reduction; phase change memory lifetime extension; request handling period; write traffic distribution; Ash; Computer architecture; Embedded systems; Equations; Microprocessors; Phase change materials; Random access memory; Application specific; endurance; phase change memory; wear leveling; write activity reduction;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2014.2341922
  • Filename
    6899774