DocumentCode
731339
Title
Time integrated study of x-ray emission by APF plasma focus device
Author
Habibi, Morteza
Author_Institution
Energy Eng. & Phys. Dept., Amirkabir Univ. of Technol., Tehran, Iran
fYear
2015
fDate
24-28 May 2015
Firstpage
1
Lastpage
1
Abstract
Summary form only given. Time-resolved studies of soft and hard x-ray were carried out over a wide range of argon pressures by employing an array of 8 filtered photo PIN diodes and a scintillation detector, simultaneously. In 50% of the discharges, the soft x-ray is seen to be emitted in short multiple pulses corresponding to different compression, whereas it is a single pulse for hard x-rays corresponding to only the first strong compression. It should be stated that multiple compressions dominantly occur at low pressures and high pressures are mostly in the single compression regime. In 43% of the discharges, at all pressures except for the optimum pressure, the first period is characterized by two or more sharp peaks. The x-ray signal intensity during the second and subsequent compressions is much smaller than the first compression.
Keywords
argon; p-i-n photodiodes; plasma X-ray sources; plasma diagnostics; plasma focus; scintillation counters; APF plasma focus device; Ar; X-ray emission; X-ray signal intensity; argon pressures; filtered photo PIN diode array; hard X-ray; multiple compressions; optimum pressure; scintillation detector; short multiple pulses; single compression regime; soft X-ray; time integrated study; Argon; Arrays; Detectors; Discharges (electric); PIN photodiodes; Physics; Plasmas;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Sciences (ICOPS), 2015 IEEE International Conference on
Conference_Location
Antalya
Type
conf
DOI
10.1109/PLASMA.2015.7179857
Filename
7179857
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