• DocumentCode
    739518
  • Title

    Design and Analysis of CMOS High-Speed High Dynamic-Range Track-and-Hold Amplifiers

  • Author

    Yu-Cheng Liu ; Hong-Yeh Chang ; Shu-Yan Huang ; Kevin Chen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
  • Volume
    63
  • Issue
    9
  • fYear
    2015
  • Firstpage
    2841
  • Lastpage
    2853
  • Abstract
    Design and analysis of two high-speed high dynamic-range track-and-hold amplifiers are presented in this paper using 65- and 90-nm CMOS processes. To achieve remarkable circuit performance in the advanced CMOS regime, the cascode topology with an inductive peaking technique and the distributed topology are employed in the track-and-hold amplifiers. The circuit topology is investigated to obtain the design methodology of the CMOS high-speed high dynamic-range track-and-hold amplifier. The theoretical calculation is presented to completely verify the design concept. Moreover, the proposed CMOS track-and-hold amplifiers demonstrate wide bandwidth and good linearity. With a dc power consumption of 197 mW, the 65-nm CMOS track-and-hold amplifier features an input bandwidth of up to 7 GHz, a spurious-free dynamic range (SFDR) of 44.6 dB, and a total harmonic distortion (THD) of -44.5 dB. With a dc power consumption of 216 mW, the 90-nm CMOS track-and-hold amplifier features an input bandwidth of 19 GHz, an SFDR of 47.5 dB, and a THD of -44.5 dB. The proposed CMOS track-and-hold amplifiers are suitable for the high-resolution high-speed analog-to-digital converter with low dc supply voltage and power.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; harmonic distortion; sample and hold circuits; CMOS process; DC power consumption; SFDR; THD; analog-to-digital converter; bandwidth 19 GHz; cascode topology; circuit topology; complementary metal oxide semiconductor; high-speed high dynamic-range track-and-hold amplifier; inductive peaking technique; power 197 mW; power 216 mW; size 65 nm; size 90 nm; spurious-free dynamic range; total harmonic distortion; Bandwidth; CMOS integrated circuits; Capacitance; Linearity; Logic gates; Switches; Switching circuits; CMOS; RF and mixed-signal integrated circuit (IC) design; RF front ends; high-speed analog CMOS design; sampling circuits;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2015.2457434
  • Filename
    7175084