• DocumentCode
    747026
  • Title

    2008 IEEE International Integrated Reliability Workshop

  • Volume
    8
  • Issue
    2
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    435
  • Lastpage
    435
  • Abstract
    Provides a listing of upcoming conference events of interest to practitioners and researchers.
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2008.926660
  • Filename
    4539823