Versatility of SEU function and its derivation from the irradiation tests with well-defined white neutron beams

Author

Yahagi, Yasuo ; Ibe, Eishi ; Yamamoto, Shigehisa ; Yoshino, Yukiaki ; Sato, Masatoshi ; Takahashi, Yasuhiko ; Kameyama, H. ; Saito, Atsushi ; Hidaka, Mitsumori

Author_Institution

Production Eng. Res. Lab., Hitachi Ltd., Kanagawa, Japan

Volume

52

Issue

5

fYear

2005

Firstpage

1562

Lastpage

1567

Abstract

The soft-error rate estimation method used for monoenergetic and quasimonoenergetic neutron beams is validated by the well-defined white neutron spectra generated at the Los Alamos Neutron Science Center (LANSCE), Los Alamos, NM, including with regard to the single event upset (SEU) threshold energy. Moreover, it is demonstrated that the neutron energy dependence of the SEU cross section is able to derived from neutron irradiation tests for several different white neutron beams by using unfolding technique.

Keywords

DRAM chips; SRAM chips; neutron beams; neutron effects; DRAM; LANSCE; Los Alamos Neutron Science Center; SEU function; SEU threshold energy; SRAM; monoenergetic neutron beams; neutron energy dependence; neutron irradiation tests; quasimonoenergetic neutron beams; single event upset; soft-error rate estimation method; static random access memory; versatility; white neutron beams; white neutron spectra; Identity-based encryption; Laboratories; Life estimation; Neutrons; Particle beams; SRAM chips; Semiconductor devices; Shape; Single event upset; Testing; DRAM; SEU threshold energy; monoenergetic neutron; quasimonoenergetic neutrons; single event upset (SEU) cross section; static random access memory (SRAM); terrestrial neutron spectrum; unfolding; white neutrons;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2005.855820

Filename

1546459