• DocumentCode
    749556
  • Title

    Teleoperated 3-D Force Feedback From the Nanoscale With an Atomic Force Microscope

  • Author

    Onal, Cagdas Denizel ; Sitti, Metin

  • Author_Institution
    Dept. of Mech. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    9
  • Issue
    1
  • fYear
    2010
  • Firstpage
    46
  • Lastpage
    54
  • Abstract
    In this study, 3-D experimental teleoperated force feedback during contact with nanoscale surfaces is demonstrated using an atomic force microscope (AFM) on the slave side and a haptic device on the master side. To achieve 3-D force feedback, coupling between one of the horizontal forces and the vertical force is a crucial bottleneck. To solve this coupling issue, a novel force decoupling algorithm is proposed. This algorithm uses local surface slopes, an empirical friction force model, and the haptic device motion angle projected onto the surface to estimate the friction value during experiments. With this estimation, it is possible to decouple the three orthogonal forces acting on the tip of the AFM cantilever. Moreover, using an adaptive observer, parameters of the friction model can be changed online, removing the necessity to calibrate the friction model initially. Finally, a modified passivity-based bilateral control is used to reflect the scaled nanoscale forces to the master side and the operator. The performance of the system is demonstrated on experimental results for flat and non-flat, and hard and soft surfaces.
  • Keywords
    atomic force microscopy; cantilevers; force feedback; friction; micromanipulators; nanostructured materials; AFM cantilever; adaptive observer; atomic force microscope; empirical friction force model; flat surface; force decoupling algorithm; friction value; haptic device; haptic device motion angle; hard surface; horizontal force coupling; master side; modified passivity-based bilateral control; nanoscale surfaces; nonflat surface; slave side; soft surface; teleoperated 3D force feedback; vertical force; Adaptive control; atomic force microscopy (AFM); bilateral control; nanorobotics; passivity control; teleoperation;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2009.2021472
  • Filename
    4838949