• DocumentCode
    750363
  • Title

    Microwatt MOSLED Using {\\hbox {SiO}}_{\\rm x} With Buried Si Nanocrystals on Si Nano-Pillar Array

  • Author

    Lin, Gong-Ru ; Pai, Yi-Hao ; Lin, Cheng-Tao

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • Volume
    26
  • Issue
    11
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    1486
  • Lastpage
    1491
  • Abstract
    Microwatt light emission from a metal-oxide-semiconductor light-emitting diode (MOSLED) made by using SiOx film with buried Si nanocrystals on Si nano-pillar array is demonstrated. The Si nano-pillar array obtained by drying the rapidly self-aggregated Ni nano-dot-masked Si substrate exhibit size, aspect ratio, and density of 30 nm, 10, and 2.8times1010 cm-2, respectively. These high-aspect-ratio Si nano-pillar array helps to enhance the Fowler-Nordheim tunneling-based carrier injection and to facilitate the complete relaxation on total internal reflection, thus increasing the quantum efficiency by one order of magnitude and improving the light extraction from the nano-roughened device surface by three times at least. The light-emission intensity, turn-on current and power-current slope of the MOSLED are 0.2 mW/cm2 , 20-30 muA, and 3plusmn0.5 mW/A, respectively. At a biased current of 400 muA, the highest external quantum efficiency is over 0.2% to obtain the maximum EL power of > 1 muW. Compared with the same device made on smooth Si substrate under a power conversion ratio of 1 times 10-4 , such an output power performance is enhanced by at least one order of magnitude.
  • Keywords
    MIS devices; light emitting diodes; nanostructured materials; plasma CVD; silicon compounds; Fowler-Nordheim tunneling-based carrier injection; SiO; buried nanocrystals; current 20 muA to 30 muA; current 400 muA; light extraction; light-emission intensity; metal-oxide-semiconductor light-emitting diode; microwatt MOSLED; microwatt light emission; nanopillar array; nanoroughened device surface; plasma enhanced chemical vapor deposition; power-current slope; quantum efficiency; total internal reflection; turn-on current; Chemical vapor deposition; Light emitting diodes; Lithography; Nanocrystals; Nanoscale devices; Optical arrays; Optical reflection; Optical surface waves; Semiconductor films; Substrates; Metal–oxide–semiconductor light-emitting diode (MOSLED); Si nano-pillar array; plasma-enhanced chemical vapor deposition (PECVD);
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.922177
  • Filename
    4542928