DocumentCode
750835
Title
Partial discharge mechanisms in voids related to dielectric degradation
Author
Morshuis, P.H.F.
Author_Institution
Fac. Electr. Eng., Delft Univ. of Technol., Netherlands
Volume
142
Issue
1
fYear
1995
fDate
1/1/1995 12:00:00 AM
Firstpage
62
Lastpage
68
Abstract
The usefulness of time-resolved measurements is shown for the study of degradation processes of insulating materials associated with partial discharges. Using an optimised test set-up the different stages in the degradation process can be recognised. The possibilities for using the time-resolved method in practice are discussed. A promising combination of classic and time-resolved measurements is presented and clarified by the first results obtained with the discharge analysing system TEAS
Keywords
ageing; dielectric materials; dielectric measurement; electric breakdown; fault location; high-voltage techniques; impulse testing; insulation testing; partial discharges; TEAS; degradation processes; dielectric degradation; insulating materials; optimised test set-up; partial discharge; partial discharges; time-resolved measurement; time-resolved method; voids;
fLanguage
English
Journal_Title
Science, Measurement and Technology, IEE Proceedings -
Publisher
iet
ISSN
1350-2344
Type
jour
DOI
10.1049/ip-smt:19951562
Filename
370771
Link To Document