• DocumentCode
    752660
  • Title

    Two-dimensional symmetric multimode interferences in silicon square waveguides

  • Author

    Hui Chen ; Tong, D.T.K.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
  • Volume
    17
  • Issue
    4
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    801
  • Lastpage
    803
  • Abstract
    Symmetric interference in two-dimensional multimode silicon waveguides is experimentally investigated. For a 100×100 μm2 cross section, 2700-μm-long waveguide fabricated on silicon-on-insulator substrate, an 8×8 matrix of replicated images with high contrast ratio is demonstrated for 1530-1570 nm wavelength range. Symmetric interference results in reduced device length, and the actual device length is consistent with the theoretical expectation. The device also exhibits stable imaging in terms of good loss uniformity, and low wavelength and polarization dependencies among the replicated images.
  • Keywords
    elemental semiconductors; integrated optics; light interference; light polarisation; optical design techniques; optical fabrication; optical images; optical losses; optical waveguides; silicon; 1530 to 1570 nm; 2700 mum; Si; loss uniformity; polarization; silicon square waveguides; silicon-on-insulator substrate; two-dimensional symmetric multimode interferences; Interference; Optical device fabrication; Optical devices; Optical imaging; Optical polarization; Optical waveguides; Refractive index; Silicon on insulator technology; Symmetric matrices; Transmission line matrix methods; Integrated optics; multimode interference (MMI); optical power splitters;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2004.843257
  • Filename
    1411881