DocumentCode
752660
Title
Two-dimensional symmetric multimode interferences in silicon square waveguides
Author
Hui Chen ; Tong, D.T.K.
Author_Institution
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
Volume
17
Issue
4
fYear
2005
fDate
4/1/2005 12:00:00 AM
Firstpage
801
Lastpage
803
Abstract
Symmetric interference in two-dimensional multimode silicon waveguides is experimentally investigated. For a 100×100 μm2 cross section, 2700-μm-long waveguide fabricated on silicon-on-insulator substrate, an 8×8 matrix of replicated images with high contrast ratio is demonstrated for 1530-1570 nm wavelength range. Symmetric interference results in reduced device length, and the actual device length is consistent with the theoretical expectation. The device also exhibits stable imaging in terms of good loss uniformity, and low wavelength and polarization dependencies among the replicated images.
Keywords
elemental semiconductors; integrated optics; light interference; light polarisation; optical design techniques; optical fabrication; optical images; optical losses; optical waveguides; silicon; 1530 to 1570 nm; 2700 mum; Si; loss uniformity; polarization; silicon square waveguides; silicon-on-insulator substrate; two-dimensional symmetric multimode interferences; Interference; Optical device fabrication; Optical devices; Optical imaging; Optical polarization; Optical waveguides; Refractive index; Silicon on insulator technology; Symmetric matrices; Transmission line matrix methods; Integrated optics; multimode interference (MMI); optical power splitters;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2004.843257
Filename
1411881
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