Measurement of the facet modal reflectivity spectrum in high quality semiconductor traveling wave amplifiers

Author

Merritt, S.A. ; Dauga, C. ; Fox, S. ; Wu, I.-F. ; Dagenais, M.

Author_Institution

Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA

Volume

13

Issue

3

fYear

1995

fDate

3/1/1995 12:00:00 AM

Firstpage

430

Lastpage

433

Abstract

We demonstrate that the Hakki-Paoli technique, commonly used for measuring single pass gain in semiconductor lasers, can be modified to measure facet modal reflectivity down to 10^-6 in semiconductor laser amplifiers. We also introduce a new technique based on Fourier and Hilbert transformations of the spontaneous emission spectrum (the SET method) which enhances the signal-to-noise ratio and permits modal reflectivity measurements down to 10^-1

Keywords

Fourier transforms; Hilbert transforms; laser variables measurement; reflectivity; semiconductor lasers; spontaneous emission; travelling wave amplifiers; Fourier transformations; Hakki-Paoli technique; Hilbert transformations; facet modal reflectivity spectrum; high quality semiconductor traveling wave amplifiers; laser diode amplifers; modal reflectivity measurements; semiconductor laser amplifiers; semiconductor lasers; signal-to-noise ratio; single pass gain; spontaneous emission spectrum; Coatings; Density measurement; Gain measurement; Laser modes; Optical waveguides; Polarization; Reflectivity; Semiconductor optical amplifiers; Spontaneous emission; Waveguide lasers;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.372438

Filename

372438