DocumentCode
753437
Title
Design of wide-emitter single-mode laser diodes
Author
Lim, Jun Jun ; Benson, Trevor M. ; Larkins, Eric C.
Author_Institution
Sch. of Electr. & Electron. Eng., Univ. of Nottingham, UK
Volume
41
Issue
4
fYear
2005
fDate
4/1/2005 12:00:00 AM
Firstpage
506
Lastpage
516
Abstract
An accurate laser simulator is developed to investigate the influences of various device parameters on modal discrimination and beam quality to optimize the brightness of semiconductor lasers. Previous work using the Prony method is extended, both by using a more robust laser simulator to solve for the optical fields and by extending the Prony method to operating conditions above threshold. The semiconductor laser model is used to investigate the effects of various device parameters on the characteristics of a gain-guided 980-nm Al-free stripe geometry laser. The device parameters investigated are the device geometry, the thickness and doping level of the waveguiding layer and the front facet reflectivity. Together with practical and economic considerations, the device parameters of a wide emitter gain-guided laser are optimized. The optimized gain-guided laser is predicted to operate in the fundamental mode up to 1.15 W. At this maximum fundamental mode power, the slow axis beam divergence at 1/e2 points is 5.4°, the beam quality factor M2 is 1.62, the astigmatism is 27 μm, and the brightness is 61 MW/cm2sr.
Keywords
Q-factor; aberrations; brightness; laser beams; laser modes; reflectivity; semiconductor device models; semiconductor lasers; waveguide lasers; 1.15 W; 980 nm; Al-free stripe geometry laser; Prony method; astigmatism; beam quality; beam quality factor; brightness; doping level; front facet reflectivity; fundamental mode; gain-guided laser; laser diode design; laser simulator; modal discrimination; optical fields; optimized laser; semiconductor laser model; semiconductor lasers; single-mode laser diodes; slow axis beam divergence; waveguiding layer; wide-emitter laser diodes; Brightness; Diode lasers; Geometrical optics; Laser beams; Laser modes; Optical design; Robustness; Semiconductor lasers; Semiconductor process modeling; Solid modeling; High-brightness lasers; laser modeling; modal discrimination (MD); single lateral mode;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2005.843924
Filename
1411953
Link To Document