• DocumentCode
    753448
  • Title

    Sheath reversal during transient radio-frequency bias

  • Author

    Barroy, Pierre René Jean ; Goodyear, Alec ; Braithwaite, N.St.J.

  • Author_Institution
    Oxford Res. Unit, Open Univ., Oxford, UK
  • Volume
    30
  • Issue
    1
  • fYear
    2002
  • fDate
    2/1/2002 12:00:00 AM
  • Firstpage
    148
  • Lastpage
    149
  • Abstract
    Optical imaging is performed with temporal and spatial resolution in a capacitively coupled plasma. The region imaged is in front of an RF biased planar probe embedded in the center of the ground electrode of a standard Gaseous Electronics Conference (GEC) reference cell. Two main periods of interest stand out. The local sheath induced by the biasing and the main plasma bulk are affected. The first interesting period is at the onset of the RF burst on the planar probe. The voltage applied to the surface can locally reverse the sheath in front of this surface. A second interesting period is after the build up of self bias and before the extinction of the RF burst. During the steady self-bias phase, the local perturbation of optical emission amounts to less than 10%, whereas in the sheath reversal phase it reaches 70%
  • Keywords
    plasma diagnostics; plasma probes; plasma sheaths; RF biased planar probe; capacitively coupled plasma; ground electrode; local sheath; optical emission; optical imaging; planar probe; sheath reversal; spatial resolution; standard gaseous electronics conference reference cell; temporal resolution; transient radio-frequency bias; Electrodes; Electron optics; Nonlinear optics; Optical recording; Plasma accelerators; Plasma sheaths; Probes; Radio frequency; Stimulated emission; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2002.1003967
  • Filename
    1003967