DocumentCode
753788
Title
A test of the exponential MTBF and comparison of power functions of the random censoring case
Author
Kim, Jee Soo
Author_Institution
GTE Labs. Inc., Waltham, MA, USA
Volume
37
Issue
1
fYear
1988
fDate
4/1/1988 12:00:00 AM
Firstpage
103
Lastpage
107
Abstract
A hypothesis test procedure is given for testing the parameter of an exponential distribution when the reliability data are randomly censored. The effects of the severity of the censoring are studied with respect to the power functions of the test. Some remarks are made on the inadequacy of the Epstein type of testing procedure in the random censoring case
Keywords
failure analysis; reliability theory; statistical analysis; Epstein testing procedure; MTBF; exponential distribution; hypothesis test procedure; power functions; random censoring case; reliability data; Computer aided software engineering; Exponential distribution; Hardware; Laboratories; Random variables; Reliability theory; Software reliability; Statistical analysis; Statistical distributions; Testing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.3725
Filename
3725
Link To Document