DocumentCode
754603
Title
Photoelectrochemical Activities of W-Doped Titania Nanotube Arrays Fabricated by Anodization
Author
Zhao, Jianling ; Wang, Xixin ; Kang, Yingru ; Xu, Xuewen ; Li, Yangxian
Author_Institution
Sch. of Mater. Sci. & Eng., Hebei Univ. of Technol., Tianjin
Volume
20
Issue
14
fYear
2008
fDate
7/15/2008 12:00:00 AM
Firstpage
1213
Lastpage
1215
Abstract
Titania nanotube arrays and W-doped (containing 3-wt% W) titania nanotube arrays were obtained using a direct anodization method in ethylene glycol electrolyte containing 0.5-wt% HF at 60 V. Anneal was conducted to get anatase crystals. The microstructure and crystal structure of the nanotubes were characterized by scanning electron microscopy and X-ray diffraction. The ultraviolet-visible diffuse reflectance spectra of the annealed samples show that the addition of W led to the red shift of absorbance edge and a decrease of bandgap energy for about 0.14 ev. The photoelectrochemical behavior of these samples has been also studied. Results show that photocurrent densities of W-doped titania nanotube arrays were much larger than that of the undoped sample.
Keywords
X-ray diffraction; annealing; anodisation; electrolytes; energy gap; nanotechnology; photoconductivity; photoelectrochemistry; red shift; scanning electron microscopy; semiconductor materials; semiconductor nanotubes; titanium compounds; tungsten; ultraviolet spectra; visible spectra; TiO2:W; W-doped titania nanotube arrays; X-ray diffraction; absorbance edge; anodization; bandgap energy; crystal structure; ethylene glycol electrolyte; microstructure; photocurrent density; photoelectrochemical activity; red shift; scanning electron microscopy; ultraviolet-visible diffuse reflectance spectra; voltage 60 V; Annealing; Anti-freeze; Crystal microstructure; Hafnium; Nanostructures; Photoconductivity; Photonic band gap; Reflectivity; Scanning electron microscopy; X-ray diffraction; Alloys; anodization; nanotube; photoactivity; titania;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2008.925529
Filename
4544851
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